布魯克GT-K0 K1光學(xué)輪廓儀-華東代理商 詳細(xì)說明：
ContourGT Surface Metrology Product Family光學(xué)輪廓儀
產(chǎn)品簡介：
ContourGT系列結(jié)合先進(jìn)的64-bit,多核操作和分析軟件，專利白色光源干涉測量(WLI)硬件和前所未有的操作簡易性，展現(xiàn)出歷史以來最先進(jìn)的3D光學(xué)表面輪廓儀系統(tǒng)。第十代光學(xué)表面輪廓儀提供了超大視野埃米至毫米垂直范圍計量，樣品靈活安裝和領(lǐng)先可重復(fù)等性能。ContourGT系列是當(dāng)今生產(chǎn)研究和質(zhì)量控制應(yīng)用中，最廣泛使用和最直觀的3D表面計量平臺。
產(chǎn)品詳細(xì)信息：
利用超過業(yè)界最大視野最高垂直分辨率，達(dá)到無與倫比的測量性能
■ 從0.5倍到200倍的放大率能夠表示大范圍樣品表面形狀與結(jié)構(gòu)特征
■ 任意放大率下亞埃米到毫米垂直范圍能提供無與倫比的測量靈活性
■ 高分辨率相機選項提高橫向分辨率，增加R&R測量性能
運用Vision64™軟件的64-Bit, 多核處理器可加速3D表面測量和分析
■ 最新型結(jié)構(gòu)產(chǎn)量功能可大幅增加應(yīng)用數(shù)據(jù)處理能力
■ 運用多核優(yōu)化和其他技術(shù)的并行處理功能，可以提供高達(dá)10倍的判斷性計量分析輸出量
■ 無與倫比的拼接性能無間斷地將大量單獨數(shù)據(jù)綜合設(shè)置成一個連續(xù)圖像
生產(chǎn)環(huán)境中提高可靠性和可重復(fù)性的獨特計量硬件
■ 超高亮度LED專利雙源照明系統(tǒng)提供卓越的測量質(zhì)量放大率撓度
■ 優(yōu)化硬件設(shè)計可提供震動偏差R&R測量
■ 選擇模式中專利自動化自校準(zhǔn)功能可獲得工具間相關(guān)性和測量準(zhǔn)確可靠性
高度直觀用戶平臺，擁有最一流易用性，自動化和分析能力
■ 簡易高效用戶界面簡化測量與數(shù)據(jù)采集操作，提高人機工作效率
■ 獨特可視工作流程工具可直觀獲得過濾和分析選項擴展庫
■ 為客戶具體要求設(shè)置客戶報告提煉分析數(shù)據(jù)功能
Optical Surface Profiler Family
The ContourGT™ Family combines advanced 64-bit, multi-core operation and analysis software, patented white light
interferometric (WLI) hardware, and unprecedented operator ease-of-use to deliver the most advanced 3D optical surface
profilers ever developed. Veeco’s tenth-generation surface profilers provide fast, angstrom-to-millimeter vertical-range
metrology over large fields of view, with flexible sample setup and industry leading repeatability. The ContourGT Family is
the most comprehensive and intuitive 3D surface metrology platform available today for production, research and quality
control applications.
Unmatched Measurement Capabilities with Highest Vertical Resolution over Industry’s Largest Field of View
■ Magnifications from 0.5X to 200X enable characterization of a wide range of surface shapes and textures
■ Sub-angstrom-to-millimeter vertical range at any magnification delivers unparalleled
measurement flexibility
■ High-resolution camera option increases lateral resolution and improves gauge R&R 64-Bit, Multi-Core Processor with Vision64™ar Software for Accelerated 3D Surface Measurement
and Analyses
■ New architecture yields order of magnitude increase in application data processing capacity
■ Parallel processing using multi-core optimization and other techniques provides up to 10x higher throughput on critical metrology analyses
■ Unmatched stitching capability seamlessly synthesizes thousands of individual datasets into one contiguous image.
Unique Metrology Hardware for Enhanced Reliability and Repeatability in Production Environments
■ Patented dual-source illumination with super highbrightness LEDs provides superior measurement quality and magnification flexibility
■ Optimized hardware design improves vibration tolerance and gauge R&R capability
■ Patented automatic self-calibration capability on select models ensures tool-to-tool correlation and measurement accuracy and repeatability
Highly Intuitive User Interface with Best-in-Class Ease of Use, Automation, and Analysis
■ Streamlined user interface simplifies measurement and data acquisition to increase system and
personnel efficiency
■ Unique visual workflow tools provide intuitive access to an extensive library of filters and analysis options
■ Customized reporting distills analysis data for customerspecific requirements
ContourGT-K1
Form Factor Bench top;
Vibration isolation required
XY Sample Stages 150mm (6in) manual;
Optional programmable 150mm
(6in) motorized;
±6o tip-tilt in system base
Z Focusing Stage Motorized, computer controlled;
Optional joystick controller
Optical Assembly Module Latest generation dual-LED
illumination source;
Motorized FOV carousel;
Automated filter flipper
Objectives Parfocal: 2.5x, 5x, 10x, 20x, 50x
Long working distance: 2x, 5x, 10x
Objective Mounts Single objective adapter or 4-position
motorized turret
Processor Multi-core, Windows 7.0
System Software Vision64 Operation and Analysis Software
Optional Software Analysis MATLAB
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